Research Output per year
Research Output per year
Personal profile
Research Interests
Chemical Engineering
Education/Academic qualification
Indian Institute of Technology, Bombay
15-07-2005 → 08-08-2010
Award Date: 08-08-2010
National Institute of Technology Karnataka
15-07-1996 → 15-08-1996
Award Date: 30-09-1998
RVCE
01-08-1991 → 30-07-1995
Award Date: 30-06-1995
External positions
16-01-2011 → 31-07-201416-07-2008 → 15-01-201116-07-2005 → 15-07-200822-09-1999 → 15-07-2005Fingerprint
Dive into the research topics where Muddu Madakyaru is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
Network
Recent external collaboration on country level. Dive into details by clicking on the dots.
Research Output
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Improved anomaly detection based on integrated multi-scale principal component analysis using wavelets: An application to high dimensional processes
Ramakrishna Kini, K. & Madakyaru, M., 2020, In: IFAC-PapersOnLine. 53, 1, p. 398-403 6 p.Research output: Contribution to journal › Conference article › peer-review
Open Access -
Improved process monitoring strategy using Kantorovich distance-independent component analysis: An application to Tennessee Eastman process
Ramakrishna Kini, K. & Madakyaru, M., 2020, In: IEEE Access. 8, p. 205863-205877 15 p., 3037730.Research output: Contribution to journal › Article › peer-review
Open Access -
Monitoring multivariate process using improved independent component analysis-generalized likelihood ratio strategy
Ramakrishna Kini, K. & Madakyaru, M., 2020, In: IFAC-PapersOnLine. 53, 1, p. 392-397 6 p.Research output: Contribution to journal › Conference article › peer-review
Open Access1 Citation (Scopus) -
Anomaly detection using multi-scale dynamic principal component analysis for Tenneesse Eastman Process
Kini, K. R. & Madakyaru, M., 14-05-2019, 2019 5th Indian Control Conference, ICC 2019 - Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 219-224 6 p. 8715552. (2019 5th Indian Control Conference, ICC 2019 - Proceedings).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
4 Citations (Scopus) -
Improved fault detection using Dynamic Independent Component Analysis (DICA): An application to multi-variate system
Kini, K. R. & Madakyaru, M., 08-2019, 2019 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics, DISCOVER 2019 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 9008090. (2019 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics, DISCOVER 2019 - Proceedings).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution