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Muddu Madakyaru

BE (Chemical), MTech(Chemical), PhD(Chemical Engineering and Process control)

 https://orcid.org/0000-0002-2518-5190
  • 282 Citations
  • 10 h-Index
19962019

Research output per year

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Personal profile

Research Interests

Chemical Engineering

Education/Academic qualification

Indian Institute of Technology, Bombay

15-07-2005 → 08-08-2010

Award Date: 08-08-2010

National Institute of Technology Karnataka

15-07-1996 → 15-08-1996

Award Date: 30-09-1998

RVCE

01-08-1991 → 30-07-1995

Award Date: 30-06-1995

External positions

16-01-2011 → 31-07-2014

16-07-2008 → 15-01-2011

16-07-2005 → 15-07-2008

22-09-1999 → 15-07-2005

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Research Output

  • 282 Citations
  • 10 h-Index
  • 14 Article
  • 7 Conference contribution
  • 1 Chapter

Anomaly detection using multi-scale dynamic principal component analysis for Tenneesse Eastman Process

Kini, K. R. & Madakyaru, M., 14-05-2019, 2019 5th Indian Control Conference, ICC 2019 - Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 219-224 6 p. 8715552. (2019 5th Indian Control Conference, ICC 2019 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

    • Monitoring Distillation Column Systems Using Improved Nonlinear Partial Least Squares-Based Strategies

    Madakyaru, M., Harrou, F. & Sun, Y., 01-12-2019, In : IEEE Sensors Journal. 19, 23, p. 11697-11705 9 p., 8807170.

    Research output: Contribution to journal › Article

    • An Improved Multivariate Chart Using Partial Least Squares with Continuous Ranked Probability Score

    Harrou, F., Sun, Y., Madakyaru, M. & Bouyedou, B., 15-08-2018, In : IEEE Sensors Journal. 18, 16, p. 6715-6726 12 p., 8396256.

    Research output: Contribution to journal › Article

    • 13 Citations (Scopus)

    Enhanced dynamic data-driven fault detection approach: Application to a two-tank heater system

    Harrou, F., Madakyaru, M., Sun, Y. & Kammammettu, S., 02-02-2018, 2017 IEEE Symposium Series on Computational Intelligence, SSCI 2017 - Proceedings. Institute of Electrical and Electronics Engineers Inc., Vol. 2018-January. p. 1-6 6 p.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

    • 2 Citations (Scopus)

    Improved anomaly detection using multi-scale PLS and generalized likelihood ratio test

    Madakyaru, M., Harrou, F. & Sun, Y., 09-02-2017, 2016 IEEE Symposium Series on Computational Intelligence, SSCI 2016. Institute of Electrical and Electronics Engineers Inc., 7849880

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

    • 4 Citations (Scopus)