A comparative study of structural, optical and electrical properties of ZnS thin films obtained by thermal evaporation and SILAR techniques

K. Priya, V. K. Ashith, Gowrish K. Rao, Ganesh Sanjeev

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

The paper compares structural, optical and electrical properties of ZnS thin films prepared by thermal evaporation and SILAR techniques. Both techniques produced well-adherent films with uniform substrate coverage. Films were found to be polycrystalline in both the cases. Crystallite size of the films was found to improve with thickness. Thermal evaporated films were found to possess comparatively better electrical properties owing to their superior crystallanity. However optical absorption characteristics of both the films were found to be similar. Detailed structural, optical and electrical studies reveal that the SILAR technique can be an effective and economical alternative to thermal evaporation for optoelectronic applications.

Original languageEnglish
Pages (from-to)10487-10493
Number of pages7
JournalCeramics International
Volume43
Issue number13
DOIs
Publication statusPublished - 2017

Fingerprint

Thermal evaporation
Structural properties
Electric properties
Optical properties
Thin films
Crystallite size
Optoelectronic devices
Light absorption
Substrates

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Process Chemistry and Technology
  • Surfaces, Coatings and Films
  • Materials Chemistry

Cite this

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A comparative study of structural, optical and electrical properties of ZnS thin films obtained by thermal evaporation and SILAR techniques. / Priya, K.; Ashith, V. K.; Rao, Gowrish K.; Sanjeev, Ganesh.

In: Ceramics International, Vol. 43, No. 13, 2017, p. 10487-10493.

Research output: Contribution to journalArticle

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