A comparative study of structural, optical and electrical properties of ZnS thin films obtained by thermal evaporation and SILAR techniques

K. Priya; V. K. Ashith; Gowrish K. Rao; Ganesh Sanjeev

doi:10.1016/j.ceramint.2017.05.094

A comparative study of structural, optical and electrical properties of ZnS thin films obtained by thermal evaporation and SILAR techniques

K. Priya, V. K. Ashith, Gowrish K. Rao, Ganesh Sanjeev

Department of Physics, Manipal Institute of Technology, Manipal

Research output: Contribution to journal › Article › peer-review

20 Citations (Scopus)

Abstract

The paper compares structural, optical and electrical properties of ZnS thin films prepared by thermal evaporation and SILAR techniques. Both techniques produced well-adherent films with uniform substrate coverage. Films were found to be polycrystalline in both the cases. Crystallite size of the films was found to improve with thickness. Thermal evaporated films were found to possess comparatively better electrical properties owing to their superior crystallanity. However optical absorption characteristics of both the films were found to be similar. Detailed structural, optical and electrical studies reveal that the SILAR technique can be an effective and economical alternative to thermal evaporation for optoelectronic applications.

Original language	English
Pages (from-to)	10487-10493
Number of pages	7
Journal	Ceramics International
Volume	43
Issue number	13
DOIs	https://doi.org/10.1016/j.ceramint.2017.05.094
Publication status	Published - 2017

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Ceramics and Composites
Process Chemistry and Technology
Surfaces, Coatings and Films
Materials Chemistry

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10.1016/j.ceramint.2017.05.094

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AU - Sanjeev, Ganesh

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AB - The paper compares structural, optical and electrical properties of ZnS thin films prepared by thermal evaporation and SILAR techniques. Both techniques produced well-adherent films with uniform substrate coverage. Films were found to be polycrystalline in both the cases. Crystallite size of the films was found to improve with thickness. Thermal evaporated films were found to possess comparatively better electrical properties owing to their superior crystallanity. However optical absorption characteristics of both the films were found to be similar. Detailed structural, optical and electrical studies reveal that the SILAR technique can be an effective and economical alternative to thermal evaporation for optoelectronic applications.

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A comparative study of structural, optical and electrical properties of ZnS thin films obtained by thermal evaporation and SILAR techniques

Abstract

All Science Journal Classification (ASJC) codes

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