LED luminaires are expected to have a long lifetime, and the reliability analysis needs to be performed for practical conditions. This article proposes a generalized methodology for predicting the lifetime of LED luminaire for the desired/practical conditions. The method involves a single accelerated degradation test (ADT) and electrothermal interaction (ETI) multiplication factors to predict lifetime. Using the reliability prediction model, the light-output performance of LED luminaire for practical conditions is predicted and validated using experimentation. The reason for the failure of the LED luminaire is identified and is further reasoned with the LED package-level analysis using SEM-EDS. The work presented is useful for the lighting industry to predict the reliability and lifetime performance of any luminaire with limited resources for any desired conditions accurately.
|Number of pages||6|
|Journal||IEEE Transactions on Electron Devices|
|Publication status||Published - 07-2020|
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering