A simple strain cell for the measurement of the gauge factor of a thin film

Manjunatha Pattabi, K. Mohan Rao

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

In this article, we present the design and fabrication of a simple strain cell using a displacement dial gauge. The strain sensitivity for this cell is of the order of [formula omitted] which is approximately equal to that obtained by cantilever bending. The advantage of this cell is that it can be used for the determination of the strain for the metal films deposited on any type of substrates, which do not have well defined Young's modulus. The gauge factor for discontinuous silver film deposited on softened poly-2-vinylpyridine substrate protected by an oxide overlayer coating is determined using this strain cell and the value of the gauge factor for this film is about 45.

Original languageEnglish
Pages (from-to)2074-2075
Number of pages2
JournalReview of Scientific Instruments
Volume70
Issue number4
DOIs
Publication statusPublished - 01-01-1999

Fingerprint

Gages
Thin films
thin films
cells
Instrument dials
dials
Substrates
metal films
modulus of elasticity
Silver
Elastic moduli
silver
coatings
Fabrication
Coatings
fabrication
Oxides
oxides
Metals

All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this

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A simple strain cell for the measurement of the gauge factor of a thin film. / Pattabi, Manjunatha; Rao, K. Mohan.

In: Review of Scientific Instruments, Vol. 70, No. 4, 01.01.1999, p. 2074-2075.

Research output: Contribution to journalArticle

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