A study of microstructural properties and quantum size effect in SILAR deposited nano-crystalline CdS thin films

V. K. Ashith, K. Gowrish Rao

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)

Abstract

The paper reports deposition and characterization of CdS thin films by micro-controlled SILAR technique using CdCl2 and Na2S as precursors. The thickness of the films was found to increase with number of immersion cycles, and also with the concentration of precursor solutions. But this increase in thickness was observed only up to a certain limit beyond which films showed peeling effect. The films were found to be polycrystalline with cubic structure. The lattice constant, crystallite size and average strain on the films were found from detailed XRD analysis. Optical characterization revealed that the films exhibit quantum size effect due to their nano crystalline nature.

Original languageEnglish
Pages (from-to)197-203
Number of pages7
JournalThin Solid Films
Volume616
DOIs
Publication statusPublished - 01-10-2016

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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