A study of microstructural properties and quantum size effect in SILAR deposited nano-crystalline CdS thin films

V. K. Ashith, K. Gowrish Rao

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

The paper reports deposition and characterization of CdS thin films by micro-controlled SILAR technique using CdCl2 and Na2S as precursors. The thickness of the films was found to increase with number of immersion cycles, and also with the concentration of precursor solutions. But this increase in thickness was observed only up to a certain limit beyond which films showed peeling effect. The films were found to be polycrystalline with cubic structure. The lattice constant, crystallite size and average strain on the films were found from detailed XRD analysis. Optical characterization revealed that the films exhibit quantum size effect due to their nano crystalline nature.

Original languageEnglish
Pages (from-to)197-203
Number of pages7
JournalThin Solid Films
Volume616
DOIs
Publication statusPublished - 01-10-2016

Fingerprint

Crystalline materials
Thin films
thin films
Cadmium Chloride
peeling
Peeling
Crystallite size
submerging
Lattice constants
cycles

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Cite this

@article{e34a2c6ee08e4f6a952c7294c238f8fd,
title = "A study of microstructural properties and quantum size effect in SILAR deposited nano-crystalline CdS thin films",
abstract = "The paper reports deposition and characterization of CdS thin films by micro-controlled SILAR technique using CdCl2 and Na2S as precursors. The thickness of the films was found to increase with number of immersion cycles, and also with the concentration of precursor solutions. But this increase in thickness was observed only up to a certain limit beyond which films showed peeling effect. The films were found to be polycrystalline with cubic structure. The lattice constant, crystallite size and average strain on the films were found from detailed XRD analysis. Optical characterization revealed that the films exhibit quantum size effect due to their nano crystalline nature.",
author = "Ashith, {V. K.} and Rao, {K. Gowrish}",
year = "2016",
month = "10",
day = "1",
doi = "10.1016/j.tsf.2016.08.024",
language = "English",
volume = "616",
pages = "197--203",
journal = "Thin Solid Films",
issn = "0040-6090",
publisher = "Elsevier",

}

A study of microstructural properties and quantum size effect in SILAR deposited nano-crystalline CdS thin films. / Ashith, V. K.; Rao, K. Gowrish.

In: Thin Solid Films, Vol. 616, 01.10.2016, p. 197-203.

Research output: Contribution to journalArticle

TY - JOUR

T1 - A study of microstructural properties and quantum size effect in SILAR deposited nano-crystalline CdS thin films

AU - Ashith, V. K.

AU - Rao, K. Gowrish

PY - 2016/10/1

Y1 - 2016/10/1

N2 - The paper reports deposition and characterization of CdS thin films by micro-controlled SILAR technique using CdCl2 and Na2S as precursors. The thickness of the films was found to increase with number of immersion cycles, and also with the concentration of precursor solutions. But this increase in thickness was observed only up to a certain limit beyond which films showed peeling effect. The films were found to be polycrystalline with cubic structure. The lattice constant, crystallite size and average strain on the films were found from detailed XRD analysis. Optical characterization revealed that the films exhibit quantum size effect due to their nano crystalline nature.

AB - The paper reports deposition and characterization of CdS thin films by micro-controlled SILAR technique using CdCl2 and Na2S as precursors. The thickness of the films was found to increase with number of immersion cycles, and also with the concentration of precursor solutions. But this increase in thickness was observed only up to a certain limit beyond which films showed peeling effect. The films were found to be polycrystalline with cubic structure. The lattice constant, crystallite size and average strain on the films were found from detailed XRD analysis. Optical characterization revealed that the films exhibit quantum size effect due to their nano crystalline nature.

UR - http://www.scopus.com/inward/record.url?scp=84982227865&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84982227865&partnerID=8YFLogxK

U2 - 10.1016/j.tsf.2016.08.024

DO - 10.1016/j.tsf.2016.08.024

M3 - Article

VL - 616

SP - 197

EP - 203

JO - Thin Solid Films

JF - Thin Solid Films

SN - 0040-6090

ER -