An apparatus for the measurement of thermal expansion of solids at low temperatures

Om Prakash, Ashok Rao, P. N. Dheer

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

A dilatometer, using the three terminal capacitance technique, suitable for measurement of linear thermal expansion of solids in the temperature range 1.3-300 K is described. The dialtometer is designed such that the mounting system for the specimen does not undergo any significant changes in dimensions when the specimen is heated. The apparatus, therefore, yields in principle absolute values of α, the coefficient of linear thermal expansion. The performance of the apparatus has been checked by measurements on copper in the temperature range of 77-300 K. Some preliminary results on the behaviour of α for Y1Ba2Cu3O6.9 compound in the vicinity of superconducting transition temperature, T c are also described. The system can detect relative changes in length Δl/l 0 of about 10-8. Attempts are being made to improve the sensitivity.

Original languageEnglish
Pages (from-to)655-660
Number of pages6
JournalPramana
Volume39
Issue number6
DOIs
Publication statusPublished - 01-12-1992

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thermal expansion
extensometers
mounting
capacitance
transition temperature
copper
temperature
sensitivity
coefficients

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

Prakash, Om ; Rao, Ashok ; Dheer, P. N. / An apparatus for the measurement of thermal expansion of solids at low temperatures. In: Pramana. 1992 ; Vol. 39, No. 6. pp. 655-660.
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An apparatus for the measurement of thermal expansion of solids at low temperatures. / Prakash, Om; Rao, Ashok; Dheer, P. N.

In: Pramana, Vol. 39, No. 6, 01.12.1992, p. 655-660.

Research output: Contribution to journalArticle

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