Abstract
Wire Bonding is a well known method used for interconnecting integrated circuit (IC) die and the leads of its package. In this paper, the effect of current on the temperature of the gold (Au) ribbon used for wire bonding in the packaging of power device is presented. Infrared spectrometer study and direct thin film Pt temperature sensor analysis were used to analyze the temperature variations in gold ribbon.
Original language | English |
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Title of host publication | 2014 IEEE 2nd International Conference on Emerging Electronics |
Subtitle of host publication | Materials to Devices, ICEE 2014 - Conference Proceedings |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 9781467365277 |
DOIs | |
Publication status | Published - 01-01-2014 |
Externally published | Yes |
Event | 2014 2nd IEEE International Conference on Emerging Electronics, ICEE 2014 - Bengaluru, India Duration: 03-12-2014 → 06-12-2014 |
Conference
Conference | 2014 2nd IEEE International Conference on Emerging Electronics, ICEE 2014 |
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Country/Territory | India |
City | Bengaluru |
Period | 03-12-14 → 06-12-14 |
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering