Annealing induced strong NBE emission of SILAR deposited ZnO thin films

Swati Pujar, Gowrish K.rao

Research output: Contribution to journalConference articlepeer-review

2 Citations (Scopus)

Abstract

Deposition of ZnO thin films using SILAR method is reported. The films exhibited hexagonal wurtzite structure and the lattice parameters well matching with the theoretical values. Annealing increased the crystallite size, reduced the microstrain and dislocation density thereby proving the enhancement in the quality of the films. Morphology of the films is studied using SEM images. Absorbance spectra showed slight redshift in the absorbance edge on annealing. PL spectra showed improvement in the blue emissions on annealing which suggests device suitability in the UV region.

Original languageEnglish
Pages (from-to)56-61
Number of pages6
JournalMaterials Today: Proceedings
Volume55
DOIs
Publication statusPublished - 2022
Event9th National Conference on Condensed Matter Physics and Applications, CMPA 2021 - Virtual, Online, India
Duration: 16-09-202117-09-2021

All Science Journal Classification (ASJC) codes

  • Materials Science(all)

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