Application of accelerated life testing principles to project long term lumen maintenance of LED luminaires

K. R. Shailesh, Ciji Pearl Kurian, Savitha G. Kini, S. Tanuja, M. Vijendra Kamath

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Abstract

This work presents our effort to predict the long term reliability of LED arrays using the application of accelerated life testing principles. Assessment of long term reliability and performance of LED arrays is a testing exercise but it is also vital for successful acceptance of Solid State Lighting (SSL) systems. The objective of this work is to analyze IESNA LM-80 test data obtained from the LED manufacturers to study how failure is accelerated by stress and fit an acceleration model to the data. This acceleration model can be used to accurately project the reliability of the LED arrays under normal operating conditions. The methodology was to apply statistical analysis to LM-80 test data and obtain accelerated models for life-stress relationships and life-time distributions. The Arrhenius-Weibull, Generalised Eyring-Weibull and Inverse Power-Weibull models were obtained and were compared for their effectiveness in to predicting the reliability of LED arrays.

Original languageEnglish
Title of host publicationProceedings - ICETEEEM 2012, International Conference on Emerging Trends in Electrical Engineering and Energy Management
Pages483-488
Number of pages6
DOIs
Publication statusPublished - 2012
EventInternational Conference on Emerging Trends in Electrical Engineering and Energy Management, ICETEEEM 2012 - Chennai, Tamil Nadu, India
Duration: 13-12-201215-12-2012

Conference

ConferenceInternational Conference on Emerging Trends in Electrical Engineering and Energy Management, ICETEEEM 2012
CountryIndia
CityChennai, Tamil Nadu
Period13-12-1215-12-12

Fingerprint

Lighting fixtures
Light emitting diodes
Testing
Statistical methods
Lighting

All Science Journal Classification (ASJC) codes

  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

Cite this

Shailesh, K. R., Kurian, C. P., Kini, S. G., Tanuja, S., & Kamath, M. V. (2012). Application of accelerated life testing principles to project long term lumen maintenance of LED luminaires. In Proceedings - ICETEEEM 2012, International Conference on Emerging Trends in Electrical Engineering and Energy Management (pp. 483-488). [6494512] https://doi.org/10.1109/ICETEEEM.2012.6494512
Shailesh, K. R. ; Kurian, Ciji Pearl ; Kini, Savitha G. ; Tanuja, S. ; Kamath, M. Vijendra. / Application of accelerated life testing principles to project long term lumen maintenance of LED luminaires. Proceedings - ICETEEEM 2012, International Conference on Emerging Trends in Electrical Engineering and Energy Management. 2012. pp. 483-488
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Shailesh, KR, Kurian, CP, Kini, SG, Tanuja, S & Kamath, MV 2012, Application of accelerated life testing principles to project long term lumen maintenance of LED luminaires. in Proceedings - ICETEEEM 2012, International Conference on Emerging Trends in Electrical Engineering and Energy Management., 6494512, pp. 483-488, International Conference on Emerging Trends in Electrical Engineering and Energy Management, ICETEEEM 2012, Chennai, Tamil Nadu, India, 13-12-12. https://doi.org/10.1109/ICETEEEM.2012.6494512

Application of accelerated life testing principles to project long term lumen maintenance of LED luminaires. / Shailesh, K. R.; Kurian, Ciji Pearl; Kini, Savitha G.; Tanuja, S.; Kamath, M. Vijendra.

Proceedings - ICETEEEM 2012, International Conference on Emerging Trends in Electrical Engineering and Energy Management. 2012. p. 483-488 6494512.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Shailesh KR, Kurian CP, Kini SG, Tanuja S, Kamath MV. Application of accelerated life testing principles to project long term lumen maintenance of LED luminaires. In Proceedings - ICETEEEM 2012, International Conference on Emerging Trends in Electrical Engineering and Energy Management. 2012. p. 483-488. 6494512 https://doi.org/10.1109/ICETEEEM.2012.6494512