Copper Selenide thin films were grown by thermal evaporation method on glass substrate. The properties of the thin films were characterized by XRD, UV-Visible spectroscopy, SEM-EDS, and PL analysis. The uniformity and stoichiometry of the deposited films were confirmed by SEM-EDS analysis. The XRD results confirmed the cubic phase with prominent (1 1 1) orientation. The deposited films showed very low transmittance (∼20%) and direct band gap of about 2.35 eV. Further, PL spectra revealed the presence of defect states present in the films. The deposited films are p-type material with carrier density of 1.14 × 1016cm-3. Structural, spectroscopic, and electrical studies have confirmed the device quality of the grown films, which find potential application in the field of renewable energy.
|Number of pages||4|
|Journal||Materials Today: Proceedings|
|Publication status||Published - 2022|
|Event||9th National Conference on Condensed Matter Physics and Applications, CMPA 2021 - Virtual, Online, India|
Duration: 16-09-2021 → 17-09-2021
All Science Journal Classification (ASJC) codes
- Materials Science(all)