Dependence of solution molarity on structural, optical and electrical properties of spin coated ZnO thin films

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Abstract

Zinc oxide (ZnO) thin films were deposited on glass substrates through spin coating technique. Zinc acetate dihydrate, monoethanolamine and 2-methoxyethanol were used as the starting material, stabilizer and solvent, respectively. The effect of precursor concentration on the structural, optical and electrical properties of ZnO thin films is investigated. The X-ray diffraction studies reveal that all the films are polycrystalline in nature with preferred (002) orientation with crystallite size ranging from ~25 to 32 nm. Atomic force microscopy images infer the columnar growth of the films. From the optical measurements it was found that there was a marginal decrease in the band gap energy with increase in molarity up to 0.7 M. Optical constants and thickness of the films were found with the help of Swanepoel envelope method and were verified through ellipsometric measurements. Electrical resistivity of the grown films was found to be in the range 29–244 Ω cm, with a lowest value obtained for the films grown at 0.7 M. Carrier concentration of the grown films has also followed a similar trend. On the other hand, the Hall effect mobility (~400 cm2/Vs) was highest for the films grown at 0.7 M. Such high values make these films potential candidates for photovoltaic and display applications.

Original languageEnglish
Pages (from-to)7614-7621
Number of pages8
JournalJournal of Materials Science: Materials in Electronics
Volume27
Issue number7
DOIs
Publication statusPublished - 01-07-2016

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Zinc Oxide
Zinc oxide
zinc oxides
Oxide films
Structural properties
Electric properties
Optical properties
electrical properties
optical properties
Thin films
thin films
Zinc Acetate
monoethanolamine (MEA)
Stabilizers (agents)
Ethanolamine
Coating techniques
Optical constants
Hall effect
Spin coating
Crystallite size

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

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title = "Dependence of solution molarity on structural, optical and electrical properties of spin coated ZnO thin films",
abstract = "Zinc oxide (ZnO) thin films were deposited on glass substrates through spin coating technique. Zinc acetate dihydrate, monoethanolamine and 2-methoxyethanol were used as the starting material, stabilizer and solvent, respectively. The effect of precursor concentration on the structural, optical and electrical properties of ZnO thin films is investigated. The X-ray diffraction studies reveal that all the films are polycrystalline in nature with preferred (002) orientation with crystallite size ranging from ~25 to 32{\^A} nm. Atomic force microscopy images infer the columnar growth of the films. From the optical measurements it was found that there was a marginal decrease in the band gap energy with increase in molarity up to 0.7{\^A} M. Optical constants and thickness of the films were found with the help of Swanepoel envelope method and were verified through ellipsometric measurements. Electrical resistivity of the grown films was found to be in the range 29–244{\^A} Ω{\^A} cm, with a lowest value obtained for the films grown at 0.7{\^A} M. Carrier concentration of the grown films has also followed a similar trend. On the other hand, the Hall effect mobility (~400{\^A} cm2/Vs) was highest for the films grown at 0.7{\^A} M. Such high values make these films potential candidates for photovoltaic and display applications.",
author = "U. Chaitra and Dhananjaya Kekuda and Rao, {K. Mohan}",
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AB - Zinc oxide (ZnO) thin films were deposited on glass substrates through spin coating technique. Zinc acetate dihydrate, monoethanolamine and 2-methoxyethanol were used as the starting material, stabilizer and solvent, respectively. The effect of precursor concentration on the structural, optical and electrical properties of ZnO thin films is investigated. The X-ray diffraction studies reveal that all the films are polycrystalline in nature with preferred (002) orientation with crystallite size ranging from ~25 to 32 nm. Atomic force microscopy images infer the columnar growth of the films. From the optical measurements it was found that there was a marginal decrease in the band gap energy with increase in molarity up to 0.7 M. Optical constants and thickness of the films were found with the help of Swanepoel envelope method and were verified through ellipsometric measurements. Electrical resistivity of the grown films was found to be in the range 29–244 Ω cm, with a lowest value obtained for the films grown at 0.7 M. Carrier concentration of the grown films has also followed a similar trend. On the other hand, the Hall effect mobility (~400 cm2/Vs) was highest for the films grown at 0.7 M. Such high values make these films potential candidates for photovoltaic and display applications.

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