Depth distribution of silver particulate films deposited in softened polystyrene substrates studied through Rutherford backscattering spectrometry

Richard L. Thompson, S. C. Gurumurthy, Manjunatha Pattabi

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

The depth distribution of silver particulate films deposited on softened polystyrene substrates has been studied through Rutherford backscattering spectrometry (RBS). 150 nm thick silver films were deposited on polystyrene (PS) coated glass substrates held at 455 K and 490 K in a vacuum of 8 × 10-6Torr. The substrates were irradiated with 8 MeV electrons to a dose of 25 kGy prior to deposition. Ion scattering measurements indicated that the silver particulates are formed at a few tens of nanometers beneath the PS surface for both unirradiated and irradiated substrates. The particulate structure seems to be a two-dimensional array rather than a three-dimensional distribution. The morphology of the particulate structure, the depth of maximum concentration of the particles as well as the width of the distribution seems to depend on the deposition rate and substrate temperature. The electron irradiation of the PS substrate gives rise to the modification of the morphology of the particulate structure due to the induced polymer-metal interaction arising from the free radicals created by the irradiation.

Original languageEnglish
Article number043533
JournalJournal of Applied Physics
Volume110
Issue number4
DOIs
Publication statusPublished - 15-08-2011

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particulates
polystyrene
backscattering
silver
spectroscopy
ion scattering
electron irradiation
free radicals
dosage
vacuum
irradiation
glass
polymers
metals
electrons
interactions
temperature

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

@article{8e8e5f3433b7483786f8a3bcd5835e0f,
title = "Depth distribution of silver particulate films deposited in softened polystyrene substrates studied through Rutherford backscattering spectrometry",
abstract = "The depth distribution of silver particulate films deposited on softened polystyrene substrates has been studied through Rutherford backscattering spectrometry (RBS). 150 nm thick silver films were deposited on polystyrene (PS) coated glass substrates held at 455 K and 490 K in a vacuum of 8 × 10-6Torr. The substrates were irradiated with 8 MeV electrons to a dose of 25 kGy prior to deposition. Ion scattering measurements indicated that the silver particulates are formed at a few tens of nanometers beneath the PS surface for both unirradiated and irradiated substrates. The particulate structure seems to be a two-dimensional array rather than a three-dimensional distribution. The morphology of the particulate structure, the depth of maximum concentration of the particles as well as the width of the distribution seems to depend on the deposition rate and substrate temperature. The electron irradiation of the PS substrate gives rise to the modification of the morphology of the particulate structure due to the induced polymer-metal interaction arising from the free radicals created by the irradiation.",
author = "Thompson, {Richard L.} and Gurumurthy, {S. C.} and Manjunatha Pattabi",
year = "2011",
month = "8",
day = "15",
doi = "10.1063/1.3626470",
language = "English",
volume = "110",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics Publising LLC",
number = "4",

}

Depth distribution of silver particulate films deposited in softened polystyrene substrates studied through Rutherford backscattering spectrometry. / Thompson, Richard L.; Gurumurthy, S. C.; Pattabi, Manjunatha.

In: Journal of Applied Physics, Vol. 110, No. 4, 043533, 15.08.2011.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Depth distribution of silver particulate films deposited in softened polystyrene substrates studied through Rutherford backscattering spectrometry

AU - Thompson, Richard L.

AU - Gurumurthy, S. C.

AU - Pattabi, Manjunatha

PY - 2011/8/15

Y1 - 2011/8/15

N2 - The depth distribution of silver particulate films deposited on softened polystyrene substrates has been studied through Rutherford backscattering spectrometry (RBS). 150 nm thick silver films were deposited on polystyrene (PS) coated glass substrates held at 455 K and 490 K in a vacuum of 8 × 10-6Torr. The substrates were irradiated with 8 MeV electrons to a dose of 25 kGy prior to deposition. Ion scattering measurements indicated that the silver particulates are formed at a few tens of nanometers beneath the PS surface for both unirradiated and irradiated substrates. The particulate structure seems to be a two-dimensional array rather than a three-dimensional distribution. The morphology of the particulate structure, the depth of maximum concentration of the particles as well as the width of the distribution seems to depend on the deposition rate and substrate temperature. The electron irradiation of the PS substrate gives rise to the modification of the morphology of the particulate structure due to the induced polymer-metal interaction arising from the free radicals created by the irradiation.

AB - The depth distribution of silver particulate films deposited on softened polystyrene substrates has been studied through Rutherford backscattering spectrometry (RBS). 150 nm thick silver films were deposited on polystyrene (PS) coated glass substrates held at 455 K and 490 K in a vacuum of 8 × 10-6Torr. The substrates were irradiated with 8 MeV electrons to a dose of 25 kGy prior to deposition. Ion scattering measurements indicated that the silver particulates are formed at a few tens of nanometers beneath the PS surface for both unirradiated and irradiated substrates. The particulate structure seems to be a two-dimensional array rather than a three-dimensional distribution. The morphology of the particulate structure, the depth of maximum concentration of the particles as well as the width of the distribution seems to depend on the deposition rate and substrate temperature. The electron irradiation of the PS substrate gives rise to the modification of the morphology of the particulate structure due to the induced polymer-metal interaction arising from the free radicals created by the irradiation.

UR - http://www.scopus.com/inward/record.url?scp=80052402922&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=80052402922&partnerID=8YFLogxK

U2 - 10.1063/1.3626470

DO - 10.1063/1.3626470

M3 - Article

VL - 110

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 4

M1 - 043533

ER -