Effect of annealing temperature on the evolution of structural, microstructural, and optical properties of spin coated ZnO thin films

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Abstract

Zinc oxide (ZnO) thin films were sol-gel spin coated on glass substrates and annealed at various temperatures from 300–500 °C. Zinc acetate dihydrate (ZAD), monoethanolamine (MEA), and 2-methoxyethanol were used as the starting materials, stabilizer and solvent, respectively. The effect of annealing temperature on the structural and optical properties of the ZnO thin films was investigated by X-ray diffractometer (XRD), atomic force microscope (AFM), UV–VIS spectrophotometry and ellipsometry. The XRD results showed the films to have a preferential c-axis orientation, whereas the AFM results confirmed a columnar structure. The surface roughness increased with the increase in annealing temperature. Parameters such as ratio of free charge carrier concentration to effective mass (N/m*) and plasma frequency (ωp) were determined from the transmittance graph using the Wemple di Domenico model. Both N/m* and ωp were noticed to reduce with the increase in annealing temperature. Band gap decreased with the increase in the annealing temperature indicating absorption edge shift towards the red region.

Original languageEnglish
Pages (from-to)7115-7122
Number of pages8
JournalCeramics International
Volume43
Issue number9
DOIs
Publication statusPublished - 15-06-2017

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Zinc Oxide
Zinc oxide
Oxide films
Optical properties
Annealing
Thin films
Diffractometers
Microscopes
Temperature
Zinc Acetate
Stabilizers (agents)
X rays
Ethanolamine
Ellipsometry
Spectrophotometry
Charge carriers
Sol-gels
Carrier concentration
Structural properties
Energy gap

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Process Chemistry and Technology
  • Surfaces, Coatings and Films
  • Materials Chemistry

Cite this

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title = "Effect of annealing temperature on the evolution of structural, microstructural, and optical properties of spin coated ZnO thin films",
abstract = "Zinc oxide (ZnO) thin films were sol-gel spin coated on glass substrates and annealed at various temperatures from 300–500 °C. Zinc acetate dihydrate (ZAD), monoethanolamine (MEA), and 2-methoxyethanol were used as the starting materials, stabilizer and solvent, respectively. The effect of annealing temperature on the structural and optical properties of the ZnO thin films was investigated by X-ray diffractometer (XRD), atomic force microscope (AFM), UV–VIS spectrophotometry and ellipsometry. The XRD results showed the films to have a preferential c-axis orientation, whereas the AFM results confirmed a columnar structure. The surface roughness increased with the increase in annealing temperature. Parameters such as ratio of free charge carrier concentration to effective mass (N/m*) and plasma frequency (ωp) were determined from the transmittance graph using the Wemple di Domenico model. Both N/m* and ωp were noticed to reduce with the increase in annealing temperature. Band gap decreased with the increase in the annealing temperature indicating absorption edge shift towards the red region.",
author = "U. Chaitra and Dhananjaya Kekuda and {Mohan Rao}, K.",
year = "2017",
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TY - JOUR

T1 - Effect of annealing temperature on the evolution of structural, microstructural, and optical properties of spin coated ZnO thin films

AU - Chaitra, U.

AU - Kekuda, Dhananjaya

AU - Mohan Rao, K.

PY - 2017/6/15

Y1 - 2017/6/15

N2 - Zinc oxide (ZnO) thin films were sol-gel spin coated on glass substrates and annealed at various temperatures from 300–500 °C. Zinc acetate dihydrate (ZAD), monoethanolamine (MEA), and 2-methoxyethanol were used as the starting materials, stabilizer and solvent, respectively. The effect of annealing temperature on the structural and optical properties of the ZnO thin films was investigated by X-ray diffractometer (XRD), atomic force microscope (AFM), UV–VIS spectrophotometry and ellipsometry. The XRD results showed the films to have a preferential c-axis orientation, whereas the AFM results confirmed a columnar structure. The surface roughness increased with the increase in annealing temperature. Parameters such as ratio of free charge carrier concentration to effective mass (N/m*) and plasma frequency (ωp) were determined from the transmittance graph using the Wemple di Domenico model. Both N/m* and ωp were noticed to reduce with the increase in annealing temperature. Band gap decreased with the increase in the annealing temperature indicating absorption edge shift towards the red region.

AB - Zinc oxide (ZnO) thin films were sol-gel spin coated on glass substrates and annealed at various temperatures from 300–500 °C. Zinc acetate dihydrate (ZAD), monoethanolamine (MEA), and 2-methoxyethanol were used as the starting materials, stabilizer and solvent, respectively. The effect of annealing temperature on the structural and optical properties of the ZnO thin films was investigated by X-ray diffractometer (XRD), atomic force microscope (AFM), UV–VIS spectrophotometry and ellipsometry. The XRD results showed the films to have a preferential c-axis orientation, whereas the AFM results confirmed a columnar structure. The surface roughness increased with the increase in annealing temperature. Parameters such as ratio of free charge carrier concentration to effective mass (N/m*) and plasma frequency (ωp) were determined from the transmittance graph using the Wemple di Domenico model. Both N/m* and ωp were noticed to reduce with the increase in annealing temperature. Band gap decreased with the increase in the annealing temperature indicating absorption edge shift towards the red region.

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U2 - 10.1016/j.ceramint.2017.02.144

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JO - Ceramics International

JF - Ceramics International

SN - 0272-8842

IS - 9

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