Improved anomaly detection based on integrated multi-scale principal component analysis using wavelets: An application to high dimensional processes

Research output: Contribution to journalConference articlepeer-review

2 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Improved anomaly detection based on integrated multi-scale principal component analysis using wavelets: An application to high dimensional processes'. Together they form a unique fingerprint.

Engineering & Materials Science