Influence of annealing on the linear and nonlinear optical properties of Mn doped ZnO thin films examined by z-scan technique in CW regime

K. K. Nagaraja, S. Pramodini, P. Poornesh, Ashok Rao, H. S. Nagaraja

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Abstract

We present the studies on the influence of annealing on the third-order nonlinear optical properties of RF magnetron sputtered manganese doped zinc oxide (MZO) thin films with different doping concentration. It is revealed that the incorporation of Mn into ZnO and annealing lead to prominent changes in the third order nonlinearity. Nonlinear optical measurements were carried out by employing the z-scan technique using a continuous wave (CW) He-Ne laser of 633 nm. The z-scan results reveal that the films exhibit self-defocusing thermal nonlinearity. The third-order nonlinear optical susceptibility χ(3) was found to be of the order of 10-3 esu and 10-2 esu for annealed MZO thin films at 200 °C and 400 °C respectively. The dependence of grain size on the observed nonlinearity was revealed by atomic force microscopy analysis. Optical limiting studies were carried out for a range of input power levels and an optical limiting of about ∼8 mW was observed indicating the possible application for photonic devices.

Original languageEnglish
Pages (from-to)373-381
Number of pages9
JournalOptical Materials
Volume58
DOIs
Publication statusPublished - 01-08-2016

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Zinc Oxide
Manganese
Zinc oxide
Oxide films
continuous radiation
Optical properties
nonlinearity
Annealing
optical properties
Thin films
zinc oxides
Photonic devices
annealing
manganese
thin films
thermal blooming
Atomic force microscopy
Doping (additives)
optical measurement
Lasers

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Computer Science(all)
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

Cite this

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abstract = "We present the studies on the influence of annealing on the third-order nonlinear optical properties of RF magnetron sputtered manganese doped zinc oxide (MZO) thin films with different doping concentration. It is revealed that the incorporation of Mn into ZnO and annealing lead to prominent changes in the third order nonlinearity. Nonlinear optical measurements were carried out by employing the z-scan technique using a continuous wave (CW) He-Ne laser of 633 nm. The z-scan results reveal that the films exhibit self-defocusing thermal nonlinearity. The third-order nonlinear optical susceptibility χ(3) was found to be of the order of 10-3 esu and 10-2 esu for annealed MZO thin films at 200 °C and 400 °C respectively. The dependence of grain size on the observed nonlinearity was revealed by atomic force microscopy analysis. Optical limiting studies were carried out for a range of input power levels and an optical limiting of about ∼8 mW was observed indicating the possible application for photonic devices.",
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T1 - Influence of annealing on the linear and nonlinear optical properties of Mn doped ZnO thin films examined by z-scan technique in CW regime

AU - Nagaraja, K. K.

AU - Pramodini, S.

AU - Poornesh, P.

AU - Rao, Ashok

AU - Nagaraja, H. S.

PY - 2016/8/1

Y1 - 2016/8/1

N2 - We present the studies on the influence of annealing on the third-order nonlinear optical properties of RF magnetron sputtered manganese doped zinc oxide (MZO) thin films with different doping concentration. It is revealed that the incorporation of Mn into ZnO and annealing lead to prominent changes in the third order nonlinearity. Nonlinear optical measurements were carried out by employing the z-scan technique using a continuous wave (CW) He-Ne laser of 633 nm. The z-scan results reveal that the films exhibit self-defocusing thermal nonlinearity. The third-order nonlinear optical susceptibility χ(3) was found to be of the order of 10-3 esu and 10-2 esu for annealed MZO thin films at 200 °C and 400 °C respectively. The dependence of grain size on the observed nonlinearity was revealed by atomic force microscopy analysis. Optical limiting studies were carried out for a range of input power levels and an optical limiting of about ∼8 mW was observed indicating the possible application for photonic devices.

AB - We present the studies on the influence of annealing on the third-order nonlinear optical properties of RF magnetron sputtered manganese doped zinc oxide (MZO) thin films with different doping concentration. It is revealed that the incorporation of Mn into ZnO and annealing lead to prominent changes in the third order nonlinearity. Nonlinear optical measurements were carried out by employing the z-scan technique using a continuous wave (CW) He-Ne laser of 633 nm. The z-scan results reveal that the films exhibit self-defocusing thermal nonlinearity. The third-order nonlinear optical susceptibility χ(3) was found to be of the order of 10-3 esu and 10-2 esu for annealed MZO thin films at 200 °C and 400 °C respectively. The dependence of grain size on the observed nonlinearity was revealed by atomic force microscopy analysis. Optical limiting studies were carried out for a range of input power levels and an optical limiting of about ∼8 mW was observed indicating the possible application for photonic devices.

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