Life estimation of high power LED using distribution based reliability analysis

Prathvi Nayak, Anjan N. Padmasali, Savitha G. Kini

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Light Emitting Diodes (LEDs) are highly preferred light sources due to their high luminous efficacy, energy efficiency, physical robustness and life. Technological developments in the recent years have almost replaced conventional light sources with light emitting diodes in many applications such as hospital lighting, street lighting, theater lighting and other general illumination purpose. The reliability and performance of the LEDs are affected by the junction temperature, as it reduces the lumen output over time. This paper uses the lumen maintenance data provided by a high power LED to analyze the degradation path and determination of life time using pseudo failure time and random effect parameter. With the help of statistical models (Normal, Lognormal and Weibull) the reliability and lifetime of the LED based on lumen degradation are predicted. And using a method called Akaike Information Criterion (AIC), the best model is chosen. Validation of the model is carried out using regression analysis. Reliability modeling using these methods result in high correlative coefficient and less error.

Original languageEnglish
Title of host publicationRTEICT 2017 - 2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1626-1631
Number of pages6
Volume2018-January
ISBN (Electronic)9781509037049
DOIs
Publication statusPublished - 12-01-2018
Event2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, RTEICT 2017 - Bangalore, India
Duration: 19-05-201720-05-2017

Conference

Conference2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, RTEICT 2017
CountryIndia
CityBangalore
Period19-05-1720-05-17

Fingerprint

reliability analysis
Reliability Analysis
Reliability analysis
Diode
work environment
High Power
Light emitting diodes
light emitting diodes
lumens
illuminating
Lighting
Light sources
technical development
light sources
Degradation
theater
Street lighting
degradation
regression analysis
Reliability Modeling

All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Computer Science Applications
  • Media Technology
  • Control and Optimization
  • Instrumentation
  • Transportation
  • Communication

Cite this

Nayak, P., Padmasali, A. N., & Kini, S. G. (2018). Life estimation of high power LED using distribution based reliability analysis. In RTEICT 2017 - 2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, Proceedings (Vol. 2018-January, pp. 1626-1631). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/RTEICT.2017.8256874
Nayak, Prathvi ; Padmasali, Anjan N. ; Kini, Savitha G. / Life estimation of high power LED using distribution based reliability analysis. RTEICT 2017 - 2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, Proceedings. Vol. 2018-January Institute of Electrical and Electronics Engineers Inc., 2018. pp. 1626-1631
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Nayak, P, Padmasali, AN & Kini, SG 2018, Life estimation of high power LED using distribution based reliability analysis. in RTEICT 2017 - 2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, Proceedings. vol. 2018-January, Institute of Electrical and Electronics Engineers Inc., pp. 1626-1631, 2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, RTEICT 2017, Bangalore, India, 19-05-17. https://doi.org/10.1109/RTEICT.2017.8256874

Life estimation of high power LED using distribution based reliability analysis. / Nayak, Prathvi; Padmasali, Anjan N.; Kini, Savitha G.

RTEICT 2017 - 2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, Proceedings. Vol. 2018-January Institute of Electrical and Electronics Engineers Inc., 2018. p. 1626-1631.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Nayak P, Padmasali AN, Kini SG. Life estimation of high power LED using distribution based reliability analysis. In RTEICT 2017 - 2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, Proceedings. Vol. 2018-January. Institute of Electrical and Electronics Engineers Inc. 2018. p. 1626-1631 https://doi.org/10.1109/RTEICT.2017.8256874