Low concentration rare earth doping (Nd) and its effect on structural properties of titania thin films

Akshayakumar Kompa; M. S. Murari; Dhananjaya Kekuda; M. G. Mahesha; Mohan Rao K

doi:10.1016/j.ceramint.2021.01.206

Low concentration rare earth doping (Nd) and its effect on structural properties of titania thin films

Akshayakumar Kompa, M. S. Murari, Dhananjaya Kekuda, M. G. Mahesha, Mohan Rao K

Department of Physics, Manipal Institute of Technology, Manipal

Research output: Contribution to journal › Article › peer-review

10 Citations (Scopus)

Abstract

The work focuses on investigating the influence of low concentration (0–0.6 at %) rare earth Neodymium (Nd) as dopant on structural properties of titania (TiO₂) thin films. The thin films were deposited on glass substrates using spin coating method followed by thermal annealing at 350 °C and 450 °C, respectively. The surface morphology of the films was studied using Atomic Force Microscopy (AFM) and Field Emission Scanning Electron Microscopy (FESEM) to check the influence of Nd dopant and annealing temperature on the grain growth. Energy Dispersive X-ray Analysis (EDAX) was used to confirm the presence of Nd dopant in Nd doped titania thin films. The chemical properties of titania doped with Nd thin films were determined through X-Ray Photoelectron Spectroscopy (XPS). The core level information of constituent elements was gathered from this measurement. A shift in high resolution spectra of Ti2p and O1s towards higher binding energies was observed on doping.

Original language	English
Journal	Ceramics International
DOIs	https://doi.org/10.1016/j.ceramint.2021.01.206
Publication status	Published - 15-05-2021

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Ceramics and Composites
Process Chemistry and Technology
Surfaces, Coatings and Films
Materials Chemistry

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10.1016/j.ceramint.2021.01.206

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@article{a704f08379ce4a6884c3b759debe375c,

title = "Low concentration rare earth doping (Nd) and its effect on structural properties of titania thin films",

abstract = "The work focuses on investigating the influence of low concentration (0–0.6 at %) rare earth Neodymium (Nd) as dopant on structural properties of titania (TiO2) thin films. The thin films were deposited on glass substrates using spin coating method followed by thermal annealing at 350 °C and 450 °C, respectively. The surface morphology of the films was studied using Atomic Force Microscopy (AFM) and Field Emission Scanning Electron Microscopy (FESEM) to check the influence of Nd dopant and annealing temperature on the grain growth. Energy Dispersive X-ray Analysis (EDAX) was used to confirm the presence of Nd dopant in Nd doped titania thin films. The chemical properties of titania doped with Nd thin films were determined through X-Ray Photoelectron Spectroscopy (XPS). The core level information of constituent elements was gathered from this measurement. A shift in high resolution spectra of Ti2p and O1s towards higher binding energies was observed on doping.",

author = "Akshayakumar Kompa and Murari, {M. S.} and Dhananjaya Kekuda and Mahesha, {M. G.} and {Rao K}, Mohan",

note = "Funding Information: The authors thank IIT Roorkee for the access to XPS facility, Mangalore University for FESEM with EDAX facility and Central Instrumentation Facility (CIF) MIT MAHE, Manipal for providing other characterization facilities. One of the authors, Akshayakumar Kompa thank MIT MAHE for providing Dr. T. M. A. Pai fellowship. Publisher Copyright: {\textcopyright} 2021 Elsevier Ltd and Techna Group S.r.l. Copyright: Copyright 2021 Elsevier B.V., All rights reserved.",

year = "2021",

month = may,

day = "15",

doi = "10.1016/j.ceramint.2021.01.206",

language = "English",

journal = "Ceramics International",

issn = "0272-8842",

publisher = "Elsevier Limited",

}

TY - JOUR

T1 - Low concentration rare earth doping (Nd) and its effect on structural properties of titania thin films

AU - Kompa, Akshayakumar

AU - Murari, M. S.

AU - Kekuda, Dhananjaya

AU - Mahesha, M. G.

AU - Rao K, Mohan

N1 - Funding Information: The authors thank IIT Roorkee for the access to XPS facility, Mangalore University for FESEM with EDAX facility and Central Instrumentation Facility (CIF) MIT MAHE, Manipal for providing other characterization facilities. One of the authors, Akshayakumar Kompa thank MIT MAHE for providing Dr. T. M. A. Pai fellowship. Publisher Copyright: © 2021 Elsevier Ltd and Techna Group S.r.l. Copyright: Copyright 2021 Elsevier B.V., All rights reserved.

PY - 2021/5/15

Y1 - 2021/5/15

N2 - The work focuses on investigating the influence of low concentration (0–0.6 at %) rare earth Neodymium (Nd) as dopant on structural properties of titania (TiO2) thin films. The thin films were deposited on glass substrates using spin coating method followed by thermal annealing at 350 °C and 450 °C, respectively. The surface morphology of the films was studied using Atomic Force Microscopy (AFM) and Field Emission Scanning Electron Microscopy (FESEM) to check the influence of Nd dopant and annealing temperature on the grain growth. Energy Dispersive X-ray Analysis (EDAX) was used to confirm the presence of Nd dopant in Nd doped titania thin films. The chemical properties of titania doped with Nd thin films were determined through X-Ray Photoelectron Spectroscopy (XPS). The core level information of constituent elements was gathered from this measurement. A shift in high resolution spectra of Ti2p and O1s towards higher binding energies was observed on doping.

AB - The work focuses on investigating the influence of low concentration (0–0.6 at %) rare earth Neodymium (Nd) as dopant on structural properties of titania (TiO2) thin films. The thin films were deposited on glass substrates using spin coating method followed by thermal annealing at 350 °C and 450 °C, respectively. The surface morphology of the films was studied using Atomic Force Microscopy (AFM) and Field Emission Scanning Electron Microscopy (FESEM) to check the influence of Nd dopant and annealing temperature on the grain growth. Energy Dispersive X-ray Analysis (EDAX) was used to confirm the presence of Nd dopant in Nd doped titania thin films. The chemical properties of titania doped with Nd thin films were determined through X-Ray Photoelectron Spectroscopy (XPS). The core level information of constituent elements was gathered from this measurement. A shift in high resolution spectra of Ti2p and O1s towards higher binding energies was observed on doping.

UR - http://www.scopus.com/inward/record.url?scp=85099992986&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85099992986&partnerID=8YFLogxK

U2 - 10.1016/j.ceramint.2021.01.206

DO - 10.1016/j.ceramint.2021.01.206

M3 - Article

AN - SCOPUS:85099992986

SN - 0272-8842

JO - Ceramics International

JF - Ceramics International

ER -

Low concentration rare earth doping (Nd) and its effect on structural properties of titania thin films

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