On some intrinsic properties of the radon transform of an SRF with application to 2-D spectrum estimation

Ramesh R. Galigekere, Eugene I. Plotkin

Research output: Contribution to journalConference article

Abstract

Some important issues that arise in applications involving the Radon transform (RT) of a stationary random field (SRF), specifically 2-D spectrum estimation (SE), are brought out. An expression for the RT of an SRF is developed based on a representation of an SRF of a given power spectrum density (PSD), valid up to second order statistics. The expression is useful in relating the autocorrelation function (ACF) of the RT with the RT of the 2-D ACF, as well as in highlighting some properties of the RT associated with an SRF. Inherent windowing that is inevitable in practice, and some of its implications on 2-D SE using the RT are discussed.

Original languageEnglish
Pages (from-to)882-885
Number of pages4
JournalCanadian Conference on Electrical and Computer Engineering
Volume2
Publication statusPublished - 01-12-1995

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Radon
Autocorrelation
Power spectrum
Statistics

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

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On some intrinsic properties of the radon transform of an SRF with application to 2-D spectrum estimation. / Galigekere, Ramesh R.; Plotkin, Eugene I.

In: Canadian Conference on Electrical and Computer Engineering, Vol. 2, 01.12.1995, p. 882-885.

Research output: Contribution to journalConference article

TY - JOUR

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AU - Plotkin, Eugene I.

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