Raman spectroscopy and low temperature electrical conductivity study of thermally evaporated CdS thin films

Rashmitha Keshav, Ashok Rao, M. G. Mahesha

Research output: Contribution to journalArticle

Abstract

A systematic study has been carried out on properties of CdS thin films grown on glass substrates by thermal route and growth parameters have been optimized to achieve near stoichiometry. Raman spectroscopy of the films has been carried out to get more insight on chemical and structural information of the films. Photoluminescence study was carried out to get the knowledge of defect-states which play major role in transport mechanisms. In order to obtain electrical parameters, Hall measurement has been carried out by van der Pauw’s technique at room temperature. Also, variation of electrical resistivity of the films at temperature range 20–300 K has been studied. Finally effect of post deposition annealing on the structural, optical and electrical properties of these films has been studied.

Original languageEnglish
Article number186
JournalOptical and Quantum Electronics
Volume50
Issue number4
DOIs
Publication statusPublished - 01-04-2018

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Raman spectroscopy
Thin films
electrical resistivity
thin films
Temperature
temperature
Stoichiometry
Structural properties
stoichiometry
Photoluminescence
Electric properties
Optical properties
electrical properties
routes
Annealing
photoluminescence
optical properties
Glass
Defects
annealing

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

Cite this

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