Similarity measurement of gene using arc tan function in gene ontology

K. Vengatesan, S. B. Mahajan, P. Sanjeevikumar, R. M. Kulkarni, Sana Moin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The Gene Ontology (GO) is a technique that measures second-hand the semantic relationship of genes using an exponential and arc tan-based technique. The proposed work develops an enhanced shortest path-based measure using GO semantic relationship. The existing work presented an undeviating corridor based on an amalgam appraise of ontological match. Using GO graph and in sequence pleased are factors that improve the effectiveness of transfer functions of semantic connection of gene ontology. The semantic technique evaluates weighted paths for GO similarity measure. Other similarity measures use the shortest path in their calculation but require the specificity of a concept in hybrid measure performance of correlated genes.

Original languageEnglish
Title of host publicationAdvances in Electronics, Communication and Computing - ETAEERE 2016
PublisherSpringer Verlag
Pages801-808
Number of pages8
ISBN (Print)9789811047640
DOIs
Publication statusPublished - 01-01-2018
Externally publishedYes
EventInternational Conference on Emerging Trends and Advances in Electrical Engineering and Renewable Energy, ETAEERE 2016 - Majhitar, India
Duration: 17-12-201618-12-2016

Publication series

NameLecture Notes in Electrical Engineering
Volume443
ISSN (Print)1876-1100
ISSN (Electronic)1876-1119

Conference

ConferenceInternational Conference on Emerging Trends and Advances in Electrical Engineering and Renewable Energy, ETAEERE 2016
CountryIndia
CityMajhitar
Period17-12-1618-12-16

All Science Journal Classification (ASJC) codes

  • Industrial and Manufacturing Engineering

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  • Cite this

    Vengatesan, K., Mahajan, S. B., Sanjeevikumar, P., Kulkarni, R. M., & Moin, S. (2018). Similarity measurement of gene using arc tan function in gene ontology. In Advances in Electronics, Communication and Computing - ETAEERE 2016 (pp. 801-808). (Lecture Notes in Electrical Engineering; Vol. 443). Springer Verlag. https://doi.org/10.1007/978-981-10-4765-7_83