Simple measurement technique for resonance frequency of micromachined cantilevers

Somashekara Bhat, Enakshi Bhattacharya

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

This paper discusses a simple electrical measurement technique to determine resonance frequency of surface micromachined cantilever beams that is also suitable for packaged devices. Measurements are done on oxide anchored doped polysilicon beams. If the beam is driven by an AC signal riding on the DC bias, the beam starts vibrating. When the drive frequency matches the natural frequency of the beam, the oscillation amplitude is maximum. In this measurement, the DC bias is fixed at a value lower than the pull-in voltage. A small AC bias is then applied such that the sum of the DC and the maximum amplitude of the AC is less than the pull-in voltage. The frequency of the AC is then swept and at resonance, because of large displacement, the beam is pulled in and this is detected by a current flowing between the beam and the substrate. By iteratively adjusting the DC bias it is possible to make sure that pull-in occurs only due to resonance and the frequency setting at this point gives the natural frequency of the beam. Measured values for different beam lengths were compared with Doppler Vibrometry results and gave an excellent match.

Original languageEnglish
Title of host publicationReliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI
Volume6463
DOIs
Publication statusPublished - 2007
EventReliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI - San Jose, CA, United States
Duration: 23-01-200724-01-2007

Conference

ConferenceReliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI
CountryUnited States
CitySan Jose, CA
Period23-01-0724-01-07

Fingerprint

Resonance Frequency
Cantilever
Measurement Techniques
Natural frequencies
alternating current
direct current
Cantilever beams
Electric potential
Polysilicon
Oxides
Natural Frequency
resonant frequencies
Voltage
Substrates
Large Displacements
Cantilever Beam
cantilever beams
electric potential
Sweep
Doppler

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Bhat, S., & Bhattacharya, E. (2007). Simple measurement technique for resonance frequency of micromachined cantilevers. In Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI (Vol. 6463). [64630N] https://doi.org/10.1117/12.698280
Bhat, Somashekara ; Bhattacharya, Enakshi. / Simple measurement technique for resonance frequency of micromachined cantilevers. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI. Vol. 6463 2007.
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Bhat, S & Bhattacharya, E 2007, Simple measurement technique for resonance frequency of micromachined cantilevers. in Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI. vol. 6463, 64630N, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI, San Jose, CA, United States, 23-01-07. https://doi.org/10.1117/12.698280

Simple measurement technique for resonance frequency of micromachined cantilevers. / Bhat, Somashekara; Bhattacharya, Enakshi.

Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI. Vol. 6463 2007. 64630N.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Bhat S, Bhattacharya E. Simple measurement technique for resonance frequency of micromachined cantilevers. In Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI. Vol. 6463. 2007. 64630N https://doi.org/10.1117/12.698280