Soybean crop disease classification using machine learning techniques

Rajashree Krishna, K. V. Prema

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Machine learning is very widely used for many applications like classification and regression. Diseases in the soybean crop are classified using machine learning techniques. Physic crop properties and weather parameters are used as a attributes for classification. K nearest neighbor, naive Bayes, decision tree, neural network algorithms are used for classification. The result is compared with the ensemble classifier called bagging.

Original languageEnglish
Title of host publication2020 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics, DISCOVER 2020 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-5
Number of pages5
ISBN (Electronic)9781728198859
DOIs
Publication statusPublished - 30-10-2020
Event2020 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics, DISCOVER 2020 - Udupi, India
Duration: 30-10-202031-10-2020

Publication series

Name2020 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics, DISCOVER 2020 - Proceedings

Conference

Conference2020 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics, DISCOVER 2020
CountryIndia
CityUdupi
Period30-10-2031-10-20

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Computer Vision and Pattern Recognition
  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Control and Optimization
  • Artificial Intelligence
  • Computer Networks and Communications

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