Sprayed nanocrystalline ZMS thin films for nonlinear optical device applications

Ganesha Krishna V S, Parutagouda Shankaragouda Patil, Shivaraj R. Maidur, Mahesha MG

Research output: Contribution to journalArticle

Abstract

Growth and characterization of novel Zn(1-x)MgxS (ZMS) thin films for the nonlinear optical applications are reported here. ZMS thin films were deposited by industrial friendly spray pyrolysis method at optimized deposition conditions. XRD showed good crystallinity having crystallite size in the range 4.6–11 nm. It also confirmed the presence of mixed phases of zinc blende and wurtzite having strong orientation along (111) and (104) planes respectively. All the films have shown transmittance in the range 75%–90%. Detailed analysis of the transmittance data revealed a slight increase in the band gap from 3.42 eV to a maximum of 3.48 eV for 4 at% Mg doped thin films. Photoluminescence study confirmed the presence of intermediate bands in the doped thin films. Substantial change in third order optical susceptibility (χ(3)) and nonlinear refractive index (n2) values were observed for the doped films as compared to pristine samples. Remarkably, there was a flip from saturable absorption (SA) into the reverse saturation absorption (RSA) for the doped films. Z-scan studies showed that the spray deposited ZMS thin films are suitable for the nonlinear devices such as optical limiters and modulators.

Original languageEnglish
Article number109304
JournalOptical Materials
Volume96
DOIs
Publication statusPublished - 01-10-2019

Fingerprint

Optical devices
Thin films
thin films
sprayers
transmittance
Spray pyrolysis
Limiters
Crystallite size
wurtzite
Modulators
pyrolysis
Zinc
modulators
crystallinity
Refractive index
Photoluminescence
Energy gap
zinc
refractivity
magnetic permeability

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Computer Science(all)
  • Atomic and Molecular Physics, and Optics
  • Spectroscopy
  • Physical and Theoretical Chemistry
  • Organic Chemistry
  • Inorganic Chemistry
  • Electrical and Electronic Engineering

Cite this

Krishna V S, Ganesha ; Patil, Parutagouda Shankaragouda ; Maidur, Shivaraj R. ; MG, Mahesha. / Sprayed nanocrystalline ZMS thin films for nonlinear optical device applications. In: Optical Materials. 2019 ; Vol. 96.
@article{8e9c25a09e824599a8c7122ae97ff880,
title = "Sprayed nanocrystalline ZMS thin films for nonlinear optical device applications",
abstract = "Growth and characterization of novel Zn(1-x)MgxS (ZMS) thin films for the nonlinear optical applications are reported here. ZMS thin films were deposited by industrial friendly spray pyrolysis method at optimized deposition conditions. XRD showed good crystallinity having crystallite size in the range 4.6–11 nm. It also confirmed the presence of mixed phases of zinc blende and wurtzite having strong orientation along (111) and (104) planes respectively. All the films have shown transmittance in the range 75{\%}–90{\%}. Detailed analysis of the transmittance data revealed a slight increase in the band gap from 3.42 eV to a maximum of 3.48 eV for 4 at{\%} Mg doped thin films. Photoluminescence study confirmed the presence of intermediate bands in the doped thin films. Substantial change in third order optical susceptibility (χ(3)) and nonlinear refractive index (n2) values were observed for the doped films as compared to pristine samples. Remarkably, there was a flip from saturable absorption (SA) into the reverse saturation absorption (RSA) for the doped films. Z-scan studies showed that the spray deposited ZMS thin films are suitable for the nonlinear devices such as optical limiters and modulators.",
author = "{Krishna V S}, Ganesha and Patil, {Parutagouda Shankaragouda} and Maidur, {Shivaraj R.} and Mahesha MG",
year = "2019",
month = "10",
day = "1",
doi = "10.1016/j.optmat.2019.109304",
language = "English",
volume = "96",
journal = "Optical Materials",
issn = "0925-3467",
publisher = "Elsevier",

}

Sprayed nanocrystalline ZMS thin films for nonlinear optical device applications. / Krishna V S, Ganesha; Patil, Parutagouda Shankaragouda; Maidur, Shivaraj R.; MG, Mahesha.

In: Optical Materials, Vol. 96, 109304, 01.10.2019.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Sprayed nanocrystalline ZMS thin films for nonlinear optical device applications

AU - Krishna V S, Ganesha

AU - Patil, Parutagouda Shankaragouda

AU - Maidur, Shivaraj R.

AU - MG, Mahesha

PY - 2019/10/1

Y1 - 2019/10/1

N2 - Growth and characterization of novel Zn(1-x)MgxS (ZMS) thin films for the nonlinear optical applications are reported here. ZMS thin films were deposited by industrial friendly spray pyrolysis method at optimized deposition conditions. XRD showed good crystallinity having crystallite size in the range 4.6–11 nm. It also confirmed the presence of mixed phases of zinc blende and wurtzite having strong orientation along (111) and (104) planes respectively. All the films have shown transmittance in the range 75%–90%. Detailed analysis of the transmittance data revealed a slight increase in the band gap from 3.42 eV to a maximum of 3.48 eV for 4 at% Mg doped thin films. Photoluminescence study confirmed the presence of intermediate bands in the doped thin films. Substantial change in third order optical susceptibility (χ(3)) and nonlinear refractive index (n2) values were observed for the doped films as compared to pristine samples. Remarkably, there was a flip from saturable absorption (SA) into the reverse saturation absorption (RSA) for the doped films. Z-scan studies showed that the spray deposited ZMS thin films are suitable for the nonlinear devices such as optical limiters and modulators.

AB - Growth and characterization of novel Zn(1-x)MgxS (ZMS) thin films for the nonlinear optical applications are reported here. ZMS thin films were deposited by industrial friendly spray pyrolysis method at optimized deposition conditions. XRD showed good crystallinity having crystallite size in the range 4.6–11 nm. It also confirmed the presence of mixed phases of zinc blende and wurtzite having strong orientation along (111) and (104) planes respectively. All the films have shown transmittance in the range 75%–90%. Detailed analysis of the transmittance data revealed a slight increase in the band gap from 3.42 eV to a maximum of 3.48 eV for 4 at% Mg doped thin films. Photoluminescence study confirmed the presence of intermediate bands in the doped thin films. Substantial change in third order optical susceptibility (χ(3)) and nonlinear refractive index (n2) values were observed for the doped films as compared to pristine samples. Remarkably, there was a flip from saturable absorption (SA) into the reverse saturation absorption (RSA) for the doped films. Z-scan studies showed that the spray deposited ZMS thin films are suitable for the nonlinear devices such as optical limiters and modulators.

UR - http://www.scopus.com/inward/record.url?scp=85070656778&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85070656778&partnerID=8YFLogxK

U2 - 10.1016/j.optmat.2019.109304

DO - 10.1016/j.optmat.2019.109304

M3 - Article

VL - 96

JO - Optical Materials

JF - Optical Materials

SN - 0925-3467

M1 - 109304

ER -