Structural and optical properties of CuIn1-xAlxSe2 thin films prepared by four-source elemental evaporation

Dhananjay, J. Nagaraju, S. B. Krupanidhi

Research output: Contribution to journalArticle

26 Citations (Scopus)

Abstract

CuIn1-xAlxSe2 (CIASe) thin films with x = 0.25, 0.5 and 0.65 were prepared by four-source elemental evaporation. The structural and optical properties were investigated by X-ray diffraction, scanning electron microscopy, energy dispersive analysis, and optical transmission. The results showed that these films contain chalcopyrite structure with preferred orientation along (112) direction. The morphology, grain distribution and composition of CIASe films were studied and compared for different Al content. The optical studies revealed that the films were highly absorbing and the energy band gap calculated from transmission spectra for x = 0.25, 0.5 and 0.65 were 1.2, 1.51 and 1.73 eV, respectively. The variation of Al content in the CIASe composition offered a very effective change in the optical band gap.

Original languageEnglish
Pages (from-to)243-246
Number of pages4
JournalSolid State Communications
Volume127
Issue number3
DOIs
Publication statusPublished - 01-07-2003

Fingerprint

Structural properties
Evaporation
Optical properties
evaporation
optical properties
Thin films
thin films
Optical band gaps
Light transmission
Chemical analysis
Band structure
energy bands
Energy gap
X ray diffraction
Scanning electron microscopy
scanning electron microscopy
diffraction
x rays
energy
Direction compound

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Condensed Matter Physics
  • Materials Chemistry

Cite this

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Structural and optical properties of CuIn1-xAlxSe2 thin films prepared by four-source elemental evaporation. / Dhananjay; Nagaraju, J.; Krupanidhi, S. B.

In: Solid State Communications, Vol. 127, No. 3, 01.07.2003, p. 243-246.

Research output: Contribution to journalArticle

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