Structural, linear, and nonlinear optical properties of radio frequency-sputtered nitrogen-doped ZnO thin films studied using z-scan technique

K. K. Nagaraja, S. Pramodini, A. Santhosh Kumar, H. S. Nagaraja, P. Poornesh

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

The third-order nonlinear optical properties of undoped and nitrogen-doped ZnO thin films were evaluated using the z-scan technique. The films were sputter-deposited on glass substrates using radio frequency power. The He-Ne continuous wave laser operating at 633 nm was used as an irradiation source. A change in the growth mode in the nitrogen-doped films was observed. The grain size and roughness were found to be dependent on the nitrogen concentration, as shown by atomic force microscopy analysis. The optical band gap was determined and found to increase with nitrogen concentration in the films. Both nonlinear absorption and refraction nonlinearities were exhibited by the deposited films. The nonlinear refractive index n2, the nonlinear absorption coefficient βeff and the third-order nonlinear optical susceptibility χ(3) were determined and found to be largest. Multiple diffraction ring patterns were observed when the samples were made to interact with the laser beam and were attributed to refractive index change and thermal lensing. Further, optical power-limiting experiments were performed to determine the optical-limiting threshold and clamping values for undoped and nitrogen-doped ZnO films.

Original languageEnglish
Article number085402
JournalLaser Physics
Volume24
Issue number8
DOIs
Publication statusPublished - 01-01-2014

Fingerprint

radio frequencies
Optical properties
Nitrogen
optical properties
nitrogen
Thin films
thin films
Refractive index
refractivity
Continuous wave lasers
thermal lensing
Optical band gaps
continuous wave lasers
Refraction
Laser beams
refraction
Atomic force microscopy
absorptivity
roughness
Diffraction

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Instrumentation
  • Condensed Matter Physics
  • Industrial and Manufacturing Engineering

Cite this

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abstract = "The third-order nonlinear optical properties of undoped and nitrogen-doped ZnO thin films were evaluated using the z-scan technique. The films were sputter-deposited on glass substrates using radio frequency power. The He-Ne continuous wave laser operating at 633 nm was used as an irradiation source. A change in the growth mode in the nitrogen-doped films was observed. The grain size and roughness were found to be dependent on the nitrogen concentration, as shown by atomic force microscopy analysis. The optical band gap was determined and found to increase with nitrogen concentration in the films. Both nonlinear absorption and refraction nonlinearities were exhibited by the deposited films. The nonlinear refractive index n2, the nonlinear absorption coefficient βeff and the third-order nonlinear optical susceptibility χ(3) were determined and found to be largest. Multiple diffraction ring patterns were observed when the samples were made to interact with the laser beam and were attributed to refractive index change and thermal lensing. Further, optical power-limiting experiments were performed to determine the optical-limiting threshold and clamping values for undoped and nitrogen-doped ZnO films.",
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Structural, linear, and nonlinear optical properties of radio frequency-sputtered nitrogen-doped ZnO thin films studied using z-scan technique. / Nagaraja, K. K.; Pramodini, S.; Santhosh Kumar, A.; Nagaraja, H. S.; Poornesh, P.

In: Laser Physics, Vol. 24, No. 8, 085402, 01.01.2014.

Research output: Contribution to journalArticle

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AU - Poornesh, P.

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