Third-order nonlinear optical properties of Mn doped ZnO thin films under cw laser illumination

K. K. Nagaraja, S. Pramodini, A. Santhosh Kumar, H. S. Nagaraja, P. Poornesh, Dhananjaya Kekuda

Research output: Contribution to journalArticle

110 Citations (Scopus)

Abstract

We report the measurements of third-order nonlinear optical properties of undoped zinc oxide and manganese doped zinc oxide thin films with different doping concentrations investigated using z-scan technique. Thin films were prepared by radio frequency magnetron sputtering using a compound target on glass substrate at room temperature. The structural properties of the deposited films were analysed by X-ray diffraction studies. The atomic force microscope analysis of the deposited films reveals that the grain size and roughness of the films depend on the Mn concentration. The direct energy band gap of the deposited film increases with the increase in Mn concentration in the films. The nonlinear optical measurements were carried out using a cw He-Ne laser at 633 nm wavelength. The z-scan results reveal that the films exhibit self-defocusing nonlinearity. The third-order nonlinear optical susceptibility χ(3) is found to be of the order of 10-3 esu. The films investigated here exhibit good optical power limiting at the experimental wavelength.

Original languageEnglish
Pages (from-to)431-439
Number of pages9
JournalOptical Materials
Volume35
Issue number3
DOIs
Publication statusPublished - 01-01-2013

Fingerprint

Optical properties
Lighting
illumination
optical properties
Thin films
Lasers
thin films
lasers
Zinc Oxide
Zinc oxide
zinc oxides
Wavelength
defocusing
Manganese
optical measurement
wavelengths
Band structure
Magnetron sputtering
Oxide films
energy bands

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Computer Science(all)
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

Cite this

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abstract = "We report the measurements of third-order nonlinear optical properties of undoped zinc oxide and manganese doped zinc oxide thin films with different doping concentrations investigated using z-scan technique. Thin films were prepared by radio frequency magnetron sputtering using a compound target on glass substrate at room temperature. The structural properties of the deposited films were analysed by X-ray diffraction studies. The atomic force microscope analysis of the deposited films reveals that the grain size and roughness of the films depend on the Mn concentration. The direct energy band gap of the deposited film increases with the increase in Mn concentration in the films. The nonlinear optical measurements were carried out using a cw He-Ne laser at 633 nm wavelength. The z-scan results reveal that the films exhibit self-defocusing nonlinearity. The third-order nonlinear optical susceptibility χ(3) is found to be of the order of 10-3 esu. The films investigated here exhibit good optical power limiting at the experimental wavelength.",
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Third-order nonlinear optical properties of Mn doped ZnO thin films under cw laser illumination. / Nagaraja, K. K.; Pramodini, S.; Santhosh Kumar, A.; Nagaraja, H. S.; Poornesh, P.; Kekuda, Dhananjaya.

In: Optical Materials, Vol. 35, No. 3, 01.01.2013, p. 431-439.

Research output: Contribution to journalArticle

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