Time series modelling for lifetime estimation of solid state luminaires

Ishika Chakrabarty, Anjan N. Padmasali, Savitha Kini

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Reliability analysis and estimation plays an important role in optimal decision making for any product, and solid state luminaires are no exception. This paper aims to estimate the reliability of SSL luminaires through statistically designed experiments. Using external data, inferences on the effect of various factors are drawn with the help of statistical models. Time series models have been developed using Wolfram's Mathematica and these models are used for the lifetime prediction of the luminaires at seventy percent lumen output which is also known as L70.

Original languageEnglish
Title of host publicationRTEICT 2017 - 2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages662-666
Number of pages5
Volume2018-January
ISBN (Electronic)9781509037049
DOIs
Publication statusPublished - 12-01-2018
Event2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, RTEICT 2017 - Bangalore, India
Duration: 19-05-201720-05-2017

Conference

Conference2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, RTEICT 2017
CountryIndia
CityBangalore
Period19-05-1720-05-17

Fingerprint

Lighting fixtures
Reliability Estimation
Time Series Modelling
Mathematica
Time Series Models
Reliability Analysis
Percent
Statistical Model
Exception
luminaires
time series
Time series
Lifetime
Decision Making
solid state
life (durability)
Prediction
Output
Estimate
reliability analysis

All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Computer Science Applications
  • Media Technology
  • Control and Optimization
  • Instrumentation
  • Transportation
  • Communication

Cite this

Chakrabarty, I., Padmasali, A. N., & Kini, S. (2018). Time series modelling for lifetime estimation of solid state luminaires. In RTEICT 2017 - 2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, Proceedings (Vol. 2018-January, pp. 662-666). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/RTEICT.2017.8256680
Chakrabarty, Ishika ; Padmasali, Anjan N. ; Kini, Savitha. / Time series modelling for lifetime estimation of solid state luminaires. RTEICT 2017 - 2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, Proceedings. Vol. 2018-January Institute of Electrical and Electronics Engineers Inc., 2018. pp. 662-666
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Chakrabarty, I, Padmasali, AN & Kini, S 2018, Time series modelling for lifetime estimation of solid state luminaires. in RTEICT 2017 - 2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, Proceedings. vol. 2018-January, Institute of Electrical and Electronics Engineers Inc., pp. 662-666, 2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, RTEICT 2017, Bangalore, India, 19-05-17. https://doi.org/10.1109/RTEICT.2017.8256680

Time series modelling for lifetime estimation of solid state luminaires. / Chakrabarty, Ishika; Padmasali, Anjan N.; Kini, Savitha.

RTEICT 2017 - 2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, Proceedings. Vol. 2018-January Institute of Electrical and Electronics Engineers Inc., 2018. p. 662-666.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Chakrabarty I, Padmasali AN, Kini S. Time series modelling for lifetime estimation of solid state luminaires. In RTEICT 2017 - 2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, Proceedings. Vol. 2018-January. Institute of Electrical and Electronics Engineers Inc. 2018. p. 662-666 https://doi.org/10.1109/RTEICT.2017.8256680