Trace element analysis using Laser Induced Breakdown Spectroscopy (LIBS) technique

V. K. Unnikrishnan, K. Mridul, Rajesh Nayak, Kamlesh Alti, V. B. Kartha, C. Santhosh, B. M. Suri

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Laser-Induced Breakdown Spectroscopy (LIBS) is well recognized as a promising tool for in situ/remote elemental analysis of environmental, archeological, clinical, and hazardous samples. With the aim of quantifying trace elements in such samples, using LIBS technique, an echelle spectrograph-ICCD system with broad range and good resolution has been assembled. Various important parameters of this system were studied and optimized. Conditions for getting good quality LIBS spectra and signal for multielemental analysis have been achieved, and these are discussed and illustrated in this paper.

Original languageEnglish
Title of host publicationSolid State Physics - Proceedings of the 55th DAE Solid State Physics Symposium 2010
Pages475-476
Number of pages2
Volume1349
EditionPART A
DOIs
Publication statusPublished - 12-09-2011
Event55th DAE Solid State Physics Symposium 2010 - Manipal, India
Duration: 26-12-201030-12-2010

Conference

Conference55th DAE Solid State Physics Symposium 2010
CountryIndia
CityManipal
Period26-12-1030-12-10

Fingerprint

laser-induced breakdown spectroscopy
trace elements
spectrographs

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

Unnikrishnan, V. K., Mridul, K., Nayak, R., Alti, K., Kartha, V. B., Santhosh, C., & Suri, B. M. (2011). Trace element analysis using Laser Induced Breakdown Spectroscopy (LIBS) technique. In Solid State Physics - Proceedings of the 55th DAE Solid State Physics Symposium 2010 (PART A ed., Vol. 1349, pp. 475-476) https://doi.org/10.1063/1.3605940
Unnikrishnan, V. K. ; Mridul, K. ; Nayak, Rajesh ; Alti, Kamlesh ; Kartha, V. B. ; Santhosh, C. ; Suri, B. M. / Trace element analysis using Laser Induced Breakdown Spectroscopy (LIBS) technique. Solid State Physics - Proceedings of the 55th DAE Solid State Physics Symposium 2010. Vol. 1349 PART A. ed. 2011. pp. 475-476
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Unnikrishnan, VK, Mridul, K, Nayak, R, Alti, K, Kartha, VB, Santhosh, C & Suri, BM 2011, Trace element analysis using Laser Induced Breakdown Spectroscopy (LIBS) technique. in Solid State Physics - Proceedings of the 55th DAE Solid State Physics Symposium 2010. PART A edn, vol. 1349, pp. 475-476, 55th DAE Solid State Physics Symposium 2010, Manipal, India, 26-12-10. https://doi.org/10.1063/1.3605940

Trace element analysis using Laser Induced Breakdown Spectroscopy (LIBS) technique. / Unnikrishnan, V. K.; Mridul, K.; Nayak, Rajesh; Alti, Kamlesh; Kartha, V. B.; Santhosh, C.; Suri, B. M.

Solid State Physics - Proceedings of the 55th DAE Solid State Physics Symposium 2010. Vol. 1349 PART A. ed. 2011. p. 475-476.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Unnikrishnan VK, Mridul K, Nayak R, Alti K, Kartha VB, Santhosh C et al. Trace element analysis using Laser Induced Breakdown Spectroscopy (LIBS) technique. In Solid State Physics - Proceedings of the 55th DAE Solid State Physics Symposium 2010. PART A ed. Vol. 1349. 2011. p. 475-476 https://doi.org/10.1063/1.3605940