X-ray diffraction studies of CdxZn1-xS thin films prepared by spray pyrolysis technique

Y. Raviprakash, Kasturi V. Bangera, G. K. Shivakumar

Research output: Chapter in Book/Report/Conference proceedingConference contribution


Thin films of CdxZn(1-x)S (0 ≤ x ≤ 1) were deposited on glass substrates by the chemical spray pyrolysis technique using a less used combination of chemicals. The variation of structural properties of these films in relation with composition was studied in detail. The entire study was made for a wide range of compositions of CdxZn (1-x) S thin films (x=0 to 1 in steps of 0.1). XRD studies reveal that all the films are polycrystalline with hexagonal (wurtzite) structure of which reflection peaks associated with (100), (002) and (110) planes were clearly identified for all the films and inclusion of cadmium into the structure of ZnS improved the crystallinity of the films. The value of lattice constants 'a' and 'c' was found to vary with composition from 0.382 to 0.415 nm and 0.625 to 0.675 nm respectively.

Original languageEnglish
Title of host publicationAdvanced X-Ray Characterization Techniques
Number of pages5
Publication statusPublished - 08-01-2013
EventInternational Conference on X-Ray and related Technique in Research and Industry, ICXRI 2012 - Pulau Pinang, Malaysia
Duration: 03-07-201205-07-2012

Publication series

NameAdvanced Materials Research
ISSN (Print)1022-6680


ConferenceInternational Conference on X-Ray and related Technique in Research and Industry, ICXRI 2012
CityPulau Pinang

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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