X-ray diffraction studies of CdxZn1-xS thin films prepared by spray pyrolysis technique

Y. Raviprakash, Kasturi V. Bangera, G. K. Shivakumar

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Thin films of CdxZn(1-x)S (0 ≤ x ≤ 1) were deposited on glass substrates by the chemical spray pyrolysis technique using a less used combination of chemicals. The variation of structural properties of these films in relation with composition was studied in detail. The entire study was made for a wide range of compositions of CdxZn (1-x) S thin films (x=0 to 1 in steps of 0.1). XRD studies reveal that all the films are polycrystalline with hexagonal (wurtzite) structure of which reflection peaks associated with (100), (002) and (110) planes were clearly identified for all the films and inclusion of cadmium into the structure of ZnS improved the crystallinity of the films. The value of lattice constants 'a' and 'c' was found to vary with composition from 0.382 to 0.415 nm and 0.625 to 0.675 nm respectively.

Original languageEnglish
Title of host publicationAdvanced X-Ray Characterization Techniques
Pages340-344
Number of pages5
DOIs
Publication statusPublished - 08-01-2013
EventInternational Conference on X-Ray and related Technique in Research and Industry, ICXRI 2012 - Pulau Pinang, Malaysia
Duration: 03-07-201205-07-2012

Publication series

NameAdvanced Materials Research
Volume620
ISSN (Print)1022-6680

Conference

ConferenceInternational Conference on X-Ray and related Technique in Research and Industry, ICXRI 2012
CountryMalaysia
CityPulau Pinang
Period03-07-1205-07-12

Fingerprint

Spray pyrolysis
X ray diffraction
Thin films
Chemical analysis
Cadmium
Lattice constants
Structural properties
Glass
Substrates

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Raviprakash, Y., Bangera, K. V., & Shivakumar, G. K. (2013). X-ray diffraction studies of CdxZn1-xS thin films prepared by spray pyrolysis technique. In Advanced X-Ray Characterization Techniques (pp. 340-344). (Advanced Materials Research; Vol. 620). https://doi.org/10.4028/www.scientific.net/AMR.620.340
Raviprakash, Y. ; Bangera, Kasturi V. ; Shivakumar, G. K. / X-ray diffraction studies of CdxZn1-xS thin films prepared by spray pyrolysis technique. Advanced X-Ray Characterization Techniques. 2013. pp. 340-344 (Advanced Materials Research).
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Raviprakash, Y, Bangera, KV & Shivakumar, GK 2013, X-ray diffraction studies of CdxZn1-xS thin films prepared by spray pyrolysis technique. in Advanced X-Ray Characterization Techniques. Advanced Materials Research, vol. 620, pp. 340-344, International Conference on X-Ray and related Technique in Research and Industry, ICXRI 2012, Pulau Pinang, Malaysia, 03-07-12. https://doi.org/10.4028/www.scientific.net/AMR.620.340

X-ray diffraction studies of CdxZn1-xS thin films prepared by spray pyrolysis technique. / Raviprakash, Y.; Bangera, Kasturi V.; Shivakumar, G. K.

Advanced X-Ray Characterization Techniques. 2013. p. 340-344 (Advanced Materials Research; Vol. 620).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Raviprakash Y, Bangera KV, Shivakumar GK. X-ray diffraction studies of CdxZn1-xS thin films prepared by spray pyrolysis technique. In Advanced X-Ray Characterization Techniques. 2013. p. 340-344. (Advanced Materials Research). https://doi.org/10.4028/www.scientific.net/AMR.620.340