XPS analysis of ZnS0.4Se0.6 thin films deposited by spray pyrolysis technique

Ganesha Krishna V S; Mahesha M G

doi:10.1016/j.elspec.2021.147072

XPS analysis of ZnS_0.4Se_0.6 thin films deposited by spray pyrolysis technique

Ganesha Krishna V S, Mahesha M G

Department of Physics, Manipal Institute of Technology, Manipal

Research output: Contribution to journal › Article › peer-review

9 Citations (Scopus)

Abstract

XPS being important study for the analysis of chemical state and composition at the surface level along with the bonding between elements. XPS study was carried out for the optimized spray deposited ZnS_0.4Se_0.6 thin films, which is a prominent II[sbnd]VI ternary chalcogenide optoelectronic material. Core spectra of Zn 2p, S 2p, Se 3d, and Se 3p were recorded for the analysis. As sulfur and selenium coexist in the sample, the detailed analysis of XPS is much needed. Analysis is challenging due to overlapping region of Se 3p peak and S 2p peak. Compared to previous reports, in the present sample, relatively lower charging effects were observed. The binding energies reported here could be used as reference for ZnSSe material. The composition of elements in the sample were also calculated, which agrees with the nominal composition.

Original language	English
Article number	147072
Journal	Journal of Electron Spectroscopy and Related Phenomena
Volume	249
DOIs	https://doi.org/10.1016/j.elspec.2021.147072
Publication status	Published - 05-2021

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Radiation
Atomic and Molecular Physics, and Optics
Condensed Matter Physics
Spectroscopy
Physical and Theoretical Chemistry

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10.1016/j.elspec.2021.147072

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title = "XPS analysis of ZnS0.4Se0.6 thin films deposited by spray pyrolysis technique",

abstract = "XPS being important study for the analysis of chemical state and composition at the surface level along with the bonding between elements. XPS study was carried out for the optimized spray deposited ZnS0.4Se0.6 thin films, which is a prominent II[sbnd]VI ternary chalcogenide optoelectronic material. Core spectra of Zn 2p, S 2p, Se 3d, and Se 3p were recorded for the analysis. As sulfur and selenium coexist in the sample, the detailed analysis of XPS is much needed. Analysis is challenging due to overlapping region of Se 3p peak and S 2p peak. Compared to previous reports, in the present sample, relatively lower charging effects were observed. The binding energies reported here could be used as reference for ZnSSe material. The composition of elements in the sample were also calculated, which agrees with the nominal composition.",

author = "{V S}, {Ganesha Krishna} and {M G}, Mahesha",

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year = "2021",

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doi = "10.1016/j.elspec.2021.147072",

language = "English",

volume = "249",

journal = "Journal of Electron Spectroscopy and Related Phenomena",

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T1 - XPS analysis of ZnS0.4Se0.6 thin films deposited by spray pyrolysis technique

AU - V S, Ganesha Krishna

AU - M G, Mahesha

PY - 2021/5

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N2 - XPS being important study for the analysis of chemical state and composition at the surface level along with the bonding between elements. XPS study was carried out for the optimized spray deposited ZnS0.4Se0.6 thin films, which is a prominent II[sbnd]VI ternary chalcogenide optoelectronic material. Core spectra of Zn 2p, S 2p, Se 3d, and Se 3p were recorded for the analysis. As sulfur and selenium coexist in the sample, the detailed analysis of XPS is much needed. Analysis is challenging due to overlapping region of Se 3p peak and S 2p peak. Compared to previous reports, in the present sample, relatively lower charging effects were observed. The binding energies reported here could be used as reference for ZnSSe material. The composition of elements in the sample were also calculated, which agrees with the nominal composition.

AB - XPS being important study for the analysis of chemical state and composition at the surface level along with the bonding between elements. XPS study was carried out for the optimized spray deposited ZnS0.4Se0.6 thin films, which is a prominent II[sbnd]VI ternary chalcogenide optoelectronic material. Core spectra of Zn 2p, S 2p, Se 3d, and Se 3p were recorded for the analysis. As sulfur and selenium coexist in the sample, the detailed analysis of XPS is much needed. Analysis is challenging due to overlapping region of Se 3p peak and S 2p peak. Compared to previous reports, in the present sample, relatively lower charging effects were observed. The binding energies reported here could be used as reference for ZnSSe material. The composition of elements in the sample were also calculated, which agrees with the nominal composition.

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XPS analysis of ZnS_0.4Se_0.6 thin films deposited by spray pyrolysis technique

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